SEUs, Faults and System Level Safety
An SEU or single event upset is a change in state of a storage element inside a device or system. It’s an example of the kind of fault in a system that may go unnoticed for many years as the system continues to operate as expected. This paper outlines how SEUs and other latent faults, which can affect functional safety systems, can be mitigated through a system-level approach. This can improve the projected dangerous failure rate of a functional safety system by an order of magnitude over the life of a system without requiring additional periodic or proof testing requirements upon the user.
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